A device includes illuminator configured to emit first and second illumination signal having first and second illumination intensities, respectively, in the direction of a surface region of an object to be measured, the second illumination intensity being smaller than the first illumination intensity. The device includes sensor configured to provide a first and second measurement signals based on first and second reflections of the first and second illumination signals on the surface region, respectively. The device includes evaluator configured to combine the first and second measurement signals with each other so as to obtain a combination result from which a position of the first illumination signal on the surface region may be derived, wherein an influence of a reflectance of the surface region within the combination result is reduced as compared to the influence on the first and second measurement signals.