Invention Grant
- Patent Title: Measurement device and method for a multidimensional signal analysis
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Application No.: US14942624Application Date: 2015-11-16
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Publication No.: US10579845B2Publication Date: 2020-03-03
- Inventor: Gerd Bresser , Luke Cirillo
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Lee & Hayes, P.C.
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01R23/165

Abstract:
The invention is related to a method and a measurement device for performing multidimensional signal analysis. The measurement device comprises at least one input terminal configured to apply a signal for a signal analysis. A displaying unit is configured to display the applied signal. A masking unit is configured to define a signal mask, wherein at least one signal mask parameter of the signal mask dynamically varies over the signal analysis time of the applied signal.
Public/Granted literature
- US20170138992A1 Measurement device and method for a multidimensional signal analysis Public/Granted day:2017-05-18
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