Invention Grant
- Patent Title: Sequence pattern characterization
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Application No.: US15015864Application Date: 2016-02-04
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Publication No.: US10578758B2Publication Date: 2020-03-03
- Inventor: Shin-Ju Ye
- Applicant: Shin-Ju Ye
- Applicant Address: US TX Spring
- Assignee: ExxonMobil Upstream Research Company
- Current Assignee: ExxonMobil Upstream Research Company
- Current Assignee Address: US TX Spring
- Agency: ExxonMobil Upstream Research Company-Law Department
- Main IPC: G01V1/40
- IPC: G01V1/40 ; G01V3/18 ; G01V5/04 ; G01V9/00 ; G01V1/30 ; G06K9/52 ; G06K9/00

Abstract:
A method, including: obtaining a scale-depth or scale-time phase image of a continuous wavelet transform of an input signal, the scale-depth or scale-time phase image including oval-shaped circular patterns observed on the mirrored phase image; and extracting, with a computer, hierarchical multiscale intervals from the scale-depth or scale-time phase image, wherein the hierarchical multiscale intervals correspond to the oval-shaped circular patterns observed on the mirrored scale-depth or scale-time phase image of the continuous wavelet transform of the input signal. Another method includes: characterizing, with a computer, curve shapes of intervals of a signal using beta distribution; and visualizing and analyzing, with the computer, shape parameters of the curve shapes on a shape-parameter crossplot.
Public/Granted literature
- US20160274255A1 Sequence Pattern Characterization Public/Granted day:2016-09-22
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