Invention Grant
- Patent Title: Circular scratch inspection apparatus
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Application No.: US15794848Application Date: 2017-10-26
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Publication No.: US10565698B2Publication Date: 2020-02-18
- Inventor: Kenji Kasahara , Shuhei Segawa , Osamu Ohji , Yuuki Hanawa , Shogo Kojima
- Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
- Applicant Address: JP Kobe
- Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
- Current Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
- Current Assignee Address: JP Kobe
- Agency: Oliff PLC
- Priority: JP2016-209215 20161026
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G01N21/88 ; H04N5/225

Abstract:
A circular scratch inspection apparatus includes: a camera capturing an image of a workpiece surface around a hole; illumination device emitting light to the workpiece surface around the hole, the light being reflected on the workpiece surface is not directly incident on the camera; and image processor. The image processor: generates a second-derivative image by performing secondary differentiation on luminance values in an actual image obtained by the camera; generates a second-derivative curve for each of a plurality of ruler lines, extending radially from the hole center and are set in an inspection target region on the workpiece surface; counts a first reference number of times for each ruler line; calculates a first reference total number of times; and determines presence or absence of a circular scratch by using the first reference total number of times.
Public/Granted literature
- US20180114309A1 CIRCULAR SCRATCH INSPECTION APPARATUS Public/Granted day:2018-04-26
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