Invention Grant
- Patent Title: Time-series fault detection, fault classification, and transition analysis using a K-nearest-neighbor and logistic regression approach
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Application No.: US15269530Application Date: 2016-09-19
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Publication No.: US10565513B2Publication Date: 2020-02-18
- Inventor: Dermot Cantwell
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lowenstein Sandler LLP
- Main IPC: G06N7/00
- IPC: G06N7/00 ; G06N20/00 ; G06F11/07

Abstract:
Methods and systems for time-series transient analysis of data are disclosed herein. A method includes receiving time-series data, generating a training data set including randomized data points, generating randomized data point combinations using a set of the randomized data points that are within a time window, computing distance values based on the randomized data point combinations, generating a classifier based on a plurality of computed distance values, and determining, using the classifier, a probability that new time-series data generated during a new execution of the process matches the time-series data. A system for performing the method is also disclosed.
Public/Granted literature
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06N | 基于特定计算模型的计算机系统 |
G06N7/00 | 基于特定数学模式的计算机系统 |