Invention Grant
- Patent Title: Generation of test scenarios based on risk analysis
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Application No.: US15948466Application Date: 2018-04-09
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Publication No.: US10565096B2Publication Date: 2020-02-18
- Inventor: Lukasz G. Cmielowski , Marcin Filip , Mateusz S. Matejczyk , Andrzej J. Wrobel
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Kelsey M. Skodje
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
Embodiments include a method for generation of test scenarios based on risk analysis. The method includes receiving a first set of code test scenarios, the first set of code test scenarios configured to test one or more first code components, the first code components each including first code attributes. The method also includes determining a probability of finding defects in the first code components based on the first code attributes. The method also includes generating a second set of code test scenarios based on the determining the probability of finding defects in the first code components based on the first code attributes, where the second set of one or more test scenarios is configured to test one or more second code components based on the second code attributes.
Public/Granted literature
- US20180232300A1 GENERATION OF TEST SCENARIOS BASED ON RISK ANALYSIS Public/Granted day:2018-08-16
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