A capacitance value measurement method and a capacitance value measurement device are provided. The capacitance value measurement method includes steps of: acquiring a first mapping relation; setting a standard temperature t0 of one analog-to-digital conversion circuit; and turning off all switching elements of a corresponding switching circuit other than an Ath switching element, turning on the Ath switching element, measuring a real-time temperature t of an analog-to-digital conversion sub-circuit of the analog-to-digital conversion circuit, measuring a real-time capacitance value Cn of an nth testing point, and acquiring a parasitic capacitance value of an external compensation sense line connected to the Ath switching element at the real-time temperature t of the analog-to-digital conversion sub-circuit in accordance with the real-time capacitance value Cn and the first mapping relation, where A is a positive integer.