Invention Grant
- Patent Title: Apparatus and method for measuring 3D form or deformation of an object surface using a grid pattern and reference plane
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Application No.: US15100460Application Date: 2016-04-06
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Publication No.: US10551177B2Publication Date: 2020-02-04
- Inventor: Yoshiharu Morimoto , Yoshiyuki Kusunoki , Masaki Ueki , Akihiro Masaya , Akifumi Takagi
- Applicant: 4D SENSOR INC.
- Applicant Address: JP Wakayama
- Assignee: 4D SENSOR INC.
- Current Assignee: 4D SENSOR INC.
- Current Assignee Address: JP Wakayama
- Agency: Staas & Halsey LLP
- International Application: PCT/JP2016/061324 WO 20160406
- International Announcement: WO2017/175341 WO 20171012
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G06T7/521 ; G01B11/16 ; G01B11/00

Abstract:
A measurement method for selecting a rectangle from a grid image that has been projected on a surface of an object or that has been gained by taking an image of a grid drawn on the surface of an object, inputting an image in a state where the optical system has been adjusted in such a manner that the grid phase of the above-described projected grid image or the above-described drawn grid is gained by dividing 2mπ (m is an integer) by Mx×Ny within the rectangle, sampling a rectangular region made up of Mx pixels in the x direction and Ny pixels in the y direction of the above-described grid image or an image of the above-described grid from the above-described inputted image, and finding a phase on the basis of the brightness of pixels in the above-described rectangular region.
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