- Patent Title: Structures and methods for noise isolation in semiconductor devices
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Application No.: US16035128Application Date: 2018-07-13
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Publication No.: US10546937B2Publication Date: 2020-01-28
- Inventor: Gulbagh Singh , Tsung-Han Tsai , Kun-Tsang Chuang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/417 ; H01L29/06 ; H01L29/78 ; H01L29/66

Abstract:
The present disclosure relates to a semiconductor structure includes a substrate with a top surface and first and second devices formed on the top surface of the substrate. The semiconductor structure also includes a deep isolation structure formed in the substrate and between the first and second devices. The deep isolation structure includes a top portion formed at the top surface and having a top width and a bottom surface having a bottom width larger than the top width.
Public/Granted literature
- US20190157407A1 STRUCTURES AND METHODS FOR NOISE ISOLATION IN SEMICONDUCTOR DEVICES Public/Granted day:2019-05-23
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