Invention Grant
- Patent Title: System and method for a synthetic trace model
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Application No.: US15140246Application Date: 2016-04-27
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Publication No.: US10546075B2Publication Date: 2020-01-28
- Inventor: YwhPyng Harn , Fa Yin , Xiaotao Chen
- Applicant: Futurewei Technologies, Inc.
- Applicant Address: US TX Plano
- Assignee: FUTUREWEI TECHNOLOGIES, INC.
- Current Assignee: FUTUREWEI TECHNOLOGIES, INC.
- Current Assignee Address: US TX Plano
- Agency: Slater Matsil, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A system and method for a synthetic trace model includes providing a first system model, the first system model comprising a plurality of subsystem models, each of the plurality of subsystem models having a trace format, generating a first plurality of traces from an overall pool of trace instructions, each of the first plurality of traces generated for respective ones of the plurality of subsystem models, according to the trace format of the subsystem model, executing the traces on each of the subsystem models, and evaluating execution characteristics for each trace executed on the first system model.
Public/Granted literature
- US20160335379A1 System and Method for a Synthetic Trace Model Public/Granted day:2016-11-17
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