Invention Grant
- Patent Title: High speed sampling of sensors
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Application No.: US15548813Application Date: 2016-02-05
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Publication No.: US10541650B2Publication Date: 2020-01-21
- Inventor: Julian Fells
- Applicant: Stingray Geophysical Hong Kong Limited
- Applicant Address: HK Central
- Assignee: Stingray Geophysical Hong Kong Limited
- Current Assignee: Stingray Geophysical Hong Kong Limited
- Current Assignee Address: HK Central
- Agency: Greenberg Traurig, LLP
- Priority: GB1501888 20150205
- International Application: PCT/GB2016/050276 WO 20160205
- International Announcement: WO2016/124946 WO 20160811
- Main IPC: G01D5/353
- IPC: G01D5/353 ; H03D3/04 ; H03H17/02 ; G01R23/10 ; H03M1/14 ; H03M1/50 ; H03M1/60

Abstract:
Systems and methods for interrogating sensing systems utilising bursts of samples. Bursts of samples correspond to optical pulses returning from optical sensors, where pulses are spaced at a period significantly longer than the pulse width, giving irregular sample spacing. The interrogation system and method processes the irregular busts of samples to recover phase information from received signals.
Public/Granted literature
- US20180013387A1 HIGH SPEED SAMPLING OF SENSORS Public/Granted day:2018-01-11
Information query
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