Invention Grant
- Patent Title: Systems and methods for testing RFID straps
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Application No.: US15831532Application Date: 2017-12-05
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Publication No.: US10539608B2Publication Date: 2020-01-21
- Inventor: Adrian N. Farr , Ian James Forster
- Applicant: AVERY DENNISON RETAIL INFORMATION SERVICES, LLC
- Applicant Address: US OH Mentor
- Assignee: AVERY DENNISON RETAIL INFORMATION SERVICES LLC
- Current Assignee: AVERY DENNISON RETAIL INFORMATION SERVICES LLC
- Current Assignee Address: US OH Mentor
- Agency: Avery Dennison Retail Information Services LLC
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/26 ; G01R27/02 ; G01R31/28

Abstract:
Systems and methods provided for testing remote frequency identification (RFID) straps on a web. Testing system includes a test head having a pair of contact pins configured to be moved toward the web (or configured to make contact with web moved towards them) and into contact with the web or RFID strap. Conveyor continuously moves the web to move individual RFID straps into and out of alignment with the test head. Controller causes the contact pins to move toward the web at a frequency that's greater than the frequency at which the conveyor moves consecutive RFID straps into alignment with the test head. Alternatively or additionally, the test head may have a mount formed of a compliant material that allows at least a portion of the test head to deflect while the contact pins are in contact with a continuously moving RFID strap, thereby maintaining contact between contact pins and strap.
Public/Granted literature
- US20180095126A1 SYSTEMS AND METHODS FOR TESTING RFID STRAPS Public/Granted day:2018-04-05
Information query