Invention Grant
- Patent Title: Gate drive control system for SiC and IGBT power devices to control desaturation or short circuit faults
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Application No.: US15767058Application Date: 2016-10-20
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Publication No.: US10530353B2Publication Date: 2020-01-07
- Inventor: Albert J. Charpentier , Alan K. Smith , Nitesh Satheesh , Robin Weber
- Applicant: AGILESWITCH, LLC
- Applicant Address: US AZ Chandler
- Assignee: MICROCHIP TECHNOLOGY INCORPORATED
- Current Assignee: MICROCHIP TECHNOLOGY INCORPORATED
- Current Assignee Address: US AZ Chandler
- Agency: RatnerPrestia
- International Application: PCT/US2016/057819 WO 20161020
- International Announcement: WO2017/070290 WO 20170427
- Main IPC: H03K17/60
- IPC: H03K17/60 ; H03K17/04 ; H03K5/24 ; H03K3/012 ; H03K17/042 ; H03K21/08 ; H03K17/16

Abstract:
A gate-drive controller for a power semiconductor device includes a master control unit (MCU) and one or more comparators that compare the output signal of the power semiconductor device to a reference value generated by the MCU. The MCU, in response to a turn-off trigger signal, generates a first intermediate drive signal for the power semiconductor device and generates a second intermediate drive signal, different from the first drive signal, when a DSAT signal indicates that the power semiconductor device is experiencing de-saturation. The MCU generates a final drive signal for the power semiconductor when the output signal of the one or more comparators indicates that the output signal of the power semiconductor device has changed relative to the reference value. The controller may also include a timer that causes the drive signals to change in predetermined intervals when the one or more comparators do not indicate a change.
Public/Granted literature
- US20190267982A1 GATE DRIVE CONTROL SYSTEM FOR SiC AND IGBT POWER DEVICES TO CONTROL DESATURATION OR SHORT CIRCUIT FAULTS Public/Granted day:2019-08-29
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