Invention Grant
- Patent Title: Electron-beam spot optimization
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Application No.: US15424270Application Date: 2017-02-03
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Publication No.: US10529529B2Publication Date: 2020-01-07
- Inventor: Dustin Peterson , Richard Zimmerman , Vince Jones , Eric Miller
- Applicant: Moxtek, Inc.
- Applicant Address: US UT Orem
- Assignee: Moxtek, Inc.
- Current Assignee: Moxtek, Inc.
- Current Assignee Address: US UT Orem
- Agency: Thorpe, North & Western, LLP
- Main IPC: H01J35/14
- IPC: H01J35/14 ; H01J35/16 ; H01J37/065 ; H01J35/06 ; H01J37/21 ; H01J37/063 ; H01J37/15 ; H05G1/52

Abstract:
Electron beam spot characteristics can be tuned in each x-ray tube by moving a focusing-ring along a longitudinal-axis of the x-ray tube. The focusing-ring can then be immovably fastened to the x-ray tube.An x-ray source can include an x-ray tube and a focusing-ring. The focusing-ring can at least partially encircle an electron-emitter, a cathode, an evacuated-enclosure, or combinations thereof. The focusing-ring can be located outside of a vacuum of the evacuated enclosure. The focusing-ring can adjust an electron-beam spot on a target material of the x-ray tube when moved along a longitudinal-axis extending linearly from the electron-emitter to the target material.
Public/Granted literature
- US20170309436A1 Electron-Beam Spot Optimization Public/Granted day:2017-10-26
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