Invention Grant
- Patent Title: Method for detecting defective pixels
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Application No.: US15520634Application Date: 2015-11-05
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Publication No.: US10404931B2Publication Date: 2019-09-03
- Inventor: Dominique Maltese , Mathieu Oudinot , Quentin Perdriau , Thomas Devichi
- Applicant: SAFRAN ELECTRONICS & DEFENSE SAS
- Applicant Address: FR Boulogne Billancourt
- Assignee: SAFRAN ELECTRONICS & DEFENSE SAS
- Current Assignee: SAFRAN ELECTRONICS & DEFENSE SAS
- Current Assignee Address: FR Boulogne Billancourt
- Agency: Oliff PLC
- Agent R. Brian Drozd
- Priority: FR1460762 20141107
- International Application: PCT/EP2015/075838 WO 20151105
- International Announcement: WO2016/071461 WO 20160512
- Main IPC: H04N5/367
- IPC: H04N5/367

Abstract:
A defective-pixel detection method included in an image-processing procedure, including a pixel-processing procedure applied to pixels of an image supplied by an image sensor. Each pixel is associated with a classification value representing a state of said pixel. The method includes, for each pixel: applying the pixel-processing procedure; analyzing a result of the pixel-processing procedure; in the event of obtaining an unusual result representing a defect on a photosite of the image sensor that supplied said pixel, incrementing a number of detections of an unusual result for said pixel; and associating said pixel with a classification value representing a defective pixel when said number reaches a first threshold.
Public/Granted literature
- US20170318245A1 METHOD FOR DETECTING DEFECTIVE PIXELS Public/Granted day:2017-11-02
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