Invention Grant
- Patent Title: Integration of materials removal and surface treatment in semiconductor device fabrication
-
Application No.: US16216006Application Date: 2018-12-11
-
Publication No.: US10403492B1Publication Date: 2019-09-03
- Inventor: Michael X. Yang , Hua Chung , Xinliang Lu , Haochen Li , Ting Xie , Qi Zhang
- Applicant: Mattson Technology, Inc.
- Applicant Address: US CA Fremont
- Assignee: Mattson Technology, Inc.
- Current Assignee: Mattson Technology, Inc.
- Current Assignee Address: US CA Fremont
- Agency: Dority & Manning, P.A.
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01J37/32 ; H01L21/67 ; H01L21/3213 ; H01L21/285

Abstract:
Processes for surface treatment of a workpiece are provided. In one example implementation, organic radicals (e.g., methyl CH3 radicals) can be generated by exciting and/or dissociating hydrogen and/or inert gas (e.g., Ar, He, etc) molecules in a remote plasma source and a subsequent reaction with organic molecule (alkanes and alkenes). The organic radicals (e.g., methyl CH3 radicals) can be exposed to the silicon and/or silicon germanium surfaces. After exposure to the organic radicals, the silicon and/or silicon germanium surfaces can be stable in air for a time period (e.g., days) with reduced surface oxidation such that the silicon and/or silicon germanium surfaces can be effectively protected from oxidation. As such, native surface oxide removal process before subsequent process steps can be eliminated.
Information query
IPC分类: