Invention Grant
- Patent Title: Semiconductor memory device
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Application No.: US15903999Application Date: 2018-02-23
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Publication No.: US10403346B2Publication Date: 2019-09-03
- Inventor: Katsuyuki Fujita , Hyuck Sang Yim
- Applicant: TOSHIBA MEMORY CORPORATION , SK HYNIX INC.
- Applicant Address: JP Tokyo KR Icheon-si
- Assignee: TOSHIBA MEMORY CORPORATION,SK HYNIX INC.
- Current Assignee: TOSHIBA MEMORY CORPORATION,SK HYNIX INC.
- Current Assignee Address: JP Tokyo KR Icheon-si
- Agency: Holtz, Holtz & Volek PC
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C11/16 ; G11C13/00 ; G05F1/56 ; G11C5/14 ; G11C7/04 ; G11C7/12 ; G11C11/4076 ; G11C11/4094

Abstract:
According to one embodiment, a semiconductor memory device comprises a first bank and a second bank. Each of the first bank and the second bank comprises a memory cell having a variable resistor element, a reference cell, a sense amplifier having a first input terminal electrically coupled to the memory cell and a second input terminal electrically coupled to the reference cell, and a first transistor electrically coupling the memory cell and the first input terminal of the sense amplifier. A gate of the first transistor of the first hank and a gate of the first transistor of the second bank are independently supplied with a voltage.
Public/Granted literature
- US20180182442A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2018-06-28
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