A magnetic tape in which a thickness of a back coating layer is equal to or smaller than 0.20 μm. A C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the back coating layer at a photoelectron take-off angle of 10 degrees is equal to or greater than 35 atom %. The full widths at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer before and after performing a vacuum heating with respect to the magnetic tape are respectively greater than 0 nm and equal to or smaller than 10.0 nm. The difference between the spacing measured after performing the vacuum heating and a spacing measured before performing the vacuum heating is greater than 0 nm and equal to or smaller than 8.0 nm.