Invention Grant
- Patent Title: Display device and method of testing the same
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Application No.: US15410605Application Date: 2017-01-19
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Publication No.: US10403186B2Publication Date: 2019-09-03
- Inventor: Hee Chul Jeon
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si, Gyeonggi-Do
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2016-0046799 20160418
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G09G3/00 ; G01R27/02 ; G01R31/04 ; G09G3/20

Abstract:
A display device and a method of testing the same are disclosed. In one aspect, the display device includes a first substrate including a display area and a non-display area arranged outside the display area. The display device also includes a bending area arranged in the non-display area, first and second signal lines arranged in the non-display area, and a first test pattern arranged between the first and second signal lines.
Public/Granted literature
- US20170301272A1 DISPLAY DEVICE AND METHOD OF TESTING THE SAME Public/Granted day:2017-10-19
Information query