Invention Grant
- Patent Title: Combined image generation of article under examination and image of test item
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Application No.: US15571933Application Date: 2015-05-07
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Publication No.: US10401306B2Publication Date: 2019-09-03
- Inventor: Zhaolin Li , David Lieblich
- Applicant: ANALOGIC CORPORATION
- Applicant Address: US MA Peabody
- Assignee: Analogic Corporation
- Current Assignee: Analogic Corporation
- Current Assignee Address: US MA Peabody
- Agency: TraskBritt
- International Application: PCT/US2015/029591 WO 20150507
- International Announcement: WO2016/178682 WO 20161110
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N23/04 ; G01N23/046 ; G06T11/00 ; G06T17/00 ; G06T19/20

Abstract:
Among other things, one or more techniques and/or systems for generating a three-dimensional combined image is provided. A three-dimensional test image of a test item is combined with a three-dimensional article image of an article that is undergoing a radiation examination to generate the three-dimensional combined image. A first selection region of the three-dimensional article image is selected. The three-dimensional test image of the test item is inserted within the first selection region. Although the test item is not actually comprised within the article under examination, the three-dimensional combined image is intended to cause the test item to appear to be comprised within the article.
Public/Granted literature
- US20180106733A1 Combined Image Generation of Article Under Examination and Image of Test Item Public/Granted day:2018-04-19
Information query