A method for manufacturing a silicon carbide semiconductor device includes preparing a silicon carbide layer including an n-type region having an n conductivity type and a p-type region having a p conductivity type, forming a material layer containing titanium, aluminum, and silicon on the n-type region and the p-type region, and forming an electrode layer in contact with the n-type region and the p-type region by heating the material layer. In forming a material layer, composition of the material layer is determined such that a point (x, y, z) (x, y, and z each being a numeric value greater than 0) representing a composition ratio among titanium, aluminum, and silicon is included in a first triangular pyramidal region having four points of the origin (0, 0, 0), a point (1, 2, 2), a point (2, 1, 2) and a point (2, 2, 1) as vertices.