Invention Grant
- Patent Title: Backside stealth dicing through tape followed by front side laser ablation dicing process
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Application No.: US16017567Application Date: 2018-06-25
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Publication No.: US10373857B2Publication Date: 2019-08-06
- Inventor: Andy E. Hooper , Nicholas Wade Clyde
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Parsons Behle & Latimer
- Main IPC: H01L21/683
- IPC: H01L21/683 ; H01L21/02 ; B23K26/364 ; H01L21/67 ; H01L21/78 ; H01L21/268 ; B23K101/40

Abstract:
A method of forming a plurality of semiconductor devices includes applying a tape material to a back side of a semiconductor device having a silicon layer on the back side and a circuitry layer on the front side, lasing with an infrared laser the silicon layer through the tape material, lasing with a second laser the circuitry layer, and expanding the tape material for form a plurality of semiconductor devices. The second layer may be an ultraviolet laser. The lasers may be irradiated in a pattern on the bottom side and the top side. The second layer may form a groove in the circuitry layer that does not penetrate the silicon layer. The infrared laser may cleave a portion of the silicon lattice of the silicon layer. A coating may be applied to the circuitry layer prior to being irradiated with the second laser.
Public/Granted literature
- US20190131160A1 Backside Stealth Dicing Through Tape Followed by Front Side Laser Ablation Dicing Process Public/Granted day:2019-05-02
Information query
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