Invention Grant
- Patent Title: Method of manufacturing a thin film transistor
-
Application No.: US15121928Application Date: 2016-04-08
-
Publication No.: US10340365B2Publication Date: 2019-07-02
- Inventor: Macai Lu
- Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Guangdong
- Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOG CO. LTD
- Current Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOG CO. LTD
- Current Assignee Address: CN Guangdong
- Agent Mark M. Friedman
- Priority: CN201610147135 20160315
- International Application: PCT/CN2016/078761 WO 20160408
- International Announcement: WO2017/156808 WO 20170921
- Main IPC: H01L27/32
- IPC: H01L27/32 ; H01L29/66 ; G02F1/1368 ; H01L21/266 ; H01L21/02 ; H01L21/027 ; H01L21/265 ; H01L21/3213 ; H01L27/12 ; H01L29/167 ; H01L29/49 ; H01L29/786

Abstract:
A method of manufacturing a thin film transistor is provided, and includes: providing a substrate; depositing a buffer layer and patterning the buffer layer; sequentially depositing an insulation layer and a first metal layer, coating a photoresist on the first metal layer; metal etching the first metal layer; ashing the photoresist; metal etching the first metal layer of the lightly doped region; implanting ions to an active area; and removing the photoresist.
Public/Granted literature
- US20180138295A1 METHOD OF MANUFACTURING A THIN FILM TRANSISTOR Public/Granted day:2018-05-17
Information query
IPC分类: