Invention Grant
- Patent Title: Method for reducing cross contamination in integrated circuit manufacturing
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Application No.: US14808250Application Date: 2015-07-24
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Publication No.: US10340186B2Publication Date: 2019-07-02
- Inventor: Hong Shen
- Applicant: SKYWORKS SOLUTIONS, INC.
- Applicant Address: US MA Woburn
- Assignee: Skyworks Solutions, Inc.
- Current Assignee: Skyworks Solutions, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Knobbe Martens Olson and Bear, LLP
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/78 ; H01L23/544 ; H01L23/532 ; H01L23/495 ; H01L23/482 ; H01L21/683 ; H01L23/00 ; H01L21/56

Abstract:
Systems, apparatuses, and methods related to the design, fabrication, and manufacture of gallium arsenide (GaAs) integrated circuits are disclosed. Copper can be used as the contact material for a GaAs integrated circuit. Metallization of the wafer and through-wafer vias can be achieved through copper plating processes disclosed herein. Various protocols can be employed during processing to avoid cross-contamination between copper-plated and non-copper-plated wafers. GaAs integrated circuits can be singulated, packaged, and incorporated into various electronic devices.
Public/Granted literature
- US20160020146A1 METHOD FOR REDUCING CROSS CONTAMINATION IN INTEGRATED CIRCUIT MANUFACTURING Public/Granted day:2016-01-21
Information query
IPC分类: