Invention Grant
- Patent Title: Methods and apparatuses relating to cleaning and imaging an ion source using reflected light
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Application No.: US15516056Application Date: 2015-09-21
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Publication No.: US10340131B2Publication Date: 2019-07-02
- Inventor: John Mark Allison
- Applicant: KRATOS ANALYTICAL LIMITED
- Applicant Address: GB Manchester, Greater Manchester
- Assignee: KRATOS ANALYTICAL LIMITED
- Current Assignee: KRATOS ANALYTICAL LIMITED
- Current Assignee Address: GB Manchester, Greater Manchester
- Agency: Sughrue Mion, PLLC
- Priority: GB1417356.1 20141001
- International Application: PCT/GB2015/052716 WO 20150921
- International Announcement: WO2016/051134 WO 20160407
- Main IPC: B08B7/00
- IPC: B08B7/00 ; H01J49/16

Abstract:
A method of cleaning an ion source. The method includes: at a first reflective surface of a mirror, reflecting light that has a wavelength in a first wavelength band onto a surface of the ion source so that contaminant material is desorbed from the surface of the ion source; at a second reflective surface of the mirror, reflecting light that has a wavelength in a second wavelength band and that comes from the surface of the ion source towards an imaging apparatus for producing an image of the surface of the ion source, wherein the light that has a wavelength in the second wavelength band passes through the first reflective surface of the mirror before being reflected at the second reflective surface of the mirror.
Public/Granted literature
- US20170309464A1 METHODS AND APPARATUSES RELATING TO CLEANING AN ION SOURCE Public/Granted day:2017-10-26
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