A memory device having an improved program speed may include a memory cell array including a plurality of memory cells, each being programmed to one of a plurality of program states; a peripheral circuit configured to perform a program operation to one or more of the plurality of memory cells, the program operation including a program voltage applying operation and a verify operation; and a control logic configured to control the peripheral circuit to simultaneously perform the verify operation for at least two program states by applying bit line voltages having different voltage levels to bit lines coupled to the plurality of memory cells.