A method includes receiving a first set of testing data associated with a first group of electronic devices. The first set of testing data is generated during a tuning test applying a first range of testing parameters. The method further includes receiving a second set of testing data associated with the first group of electronic devices. Further, the method includes determining, based on the first set of testing data and the second set of testing data, a second range of testing parameters that is less than the first range of testing parameters. The method includes testing a second group of electronic devices using a tuning test applying the second range of testing parameters.