Invention Grant
- Patent Title: Power supply built-in testing
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Application No.: US13455600Application Date: 2012-04-25
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Publication No.: US10284073B2Publication Date: 2019-05-07
- Inventor: Gary L. Hess , Kirk A. Lillestolen
- Applicant: Gary L. Hess , Kirk A. Lillestolen
- Applicant Address: US CT Windsor Locks
- Assignee: HAMILTON SUNDSTRAND CORPORATION
- Current Assignee: HAMILTON SUNDSTRAND CORPORATION
- Current Assignee Address: US CT Windsor Locks
- Agency: Cantor Colburn LLP
- Main IPC: H02M1/32
- IPC: H02M1/32 ; H02M3/156
Abstract:
A disclosed system includes a switching power supply including a switching circuit and one or more monitoring circuits configured to monitor one or more power characteristics of the switching power supply, and a processing circuit configured to control the one or more monitoring circuits to perform a built-in test (BIT) of the one or more monitoring circuits.
Public/Granted literature
- US20130289922A1 POWER SUPPLY BUILT-IN TESTING Public/Granted day:2013-10-31
Information query
