Invention Grant
- Patent Title: Semiconductor device and method for manufacturing the same
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Application No.: US15360226Application Date: 2016-11-23
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Publication No.: US10283530B2Publication Date: 2019-05-07
- Inventor: Hajime Kimura
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP
- Agency: Husch Blackwell LLP
- Priority: JP2011-103344 20110505
- Main IPC: H01L27/105
- IPC: H01L27/105 ; H01L27/12 ; H01L29/786 ; H01L29/04 ; H01L27/32

Abstract:
A semiconductor device includes a pixel electrode and a transistor which includes a first gate electrode, a first insulating layer over the first gate electrode, a semiconductor layer over the first insulating layer, a second insulating layer over the semiconductor layer, and a second gate electrode. The pixel electrode and the second gate electrode are provided over the second insulating layer. The first gate electrode has a region overlapping with the semiconductor layer with the first insulating layer provided therebetween. The second gate electrode has a region overlapping with the semiconductor layer with the second insulating layer provided therebetween. A first region is at least part of a region where the second gate electrode overlaps with the semiconductor layer. A second region is at least part of a region where the pixel electrode is provided. The second insulating layer is thinner in the first region than in the second region.
Public/Granted literature
- US20170077150A1 Semiconductor Device and Method for Manufacturing the Same Public/Granted day:2017-03-16
Information query
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