Invention Grant
- Patent Title: Microparticle composition analyzing apparatus
-
Application No.: US15216703Application Date: 2016-07-22
-
Publication No.: US10283337B2Publication Date: 2019-05-07
- Inventor: Naoki Takeda , Kazuhiro Koizumi , Takamasa Asano , Yoshiki Hasegawa
- Applicant: FUJI ELECTRIC CO., LTD.
- Applicant Address: JP Kanagawa
- Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee Address: JP Kanagawa
- Priority: JP2015-177729 20150909
- Main IPC: H01J49/04
- IPC: H01J49/04 ; G01N33/00 ; G01N15/00

Abstract:
Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.
Public/Granted literature
- US20170069476A1 MICROPARTICLE COMPOSITION ANALYZING APPARATUS Public/Granted day:2017-03-09
Information query