Invention Grant
- Patent Title: Method and apparatus for the proper ordering and enumeration of multiple successive ray-surface intersections within a ray tracing architecture
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Application No.: US15280912Application Date: 2016-09-29
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Publication No.: US10282890B2Publication Date: 2019-05-07
- Inventor: Ingo Wald
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Nicholson De Vos Webster & Elliott LLP
- Main IPC: G06T15/06
- IPC: G06T15/06 ; G06T1/20 ; G06T1/60 ; G06F12/0875

Abstract:
An apparatus and method are described for performing a distance test in a ray tracing system. For example, one embodiment of a graphics processing apparatus comprises: a ray tracing traversal/intersection unit to identify two or more ray-surface intersections, each of the ray-surface intersections being assigned a unique hit point identifier (ID); and a distance testing module to disambiguate the order of the ray-surface intersections using the hit point ID if the two or more of the ray-surface intersections share the same distance.
Public/Granted literature
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/06 | .光线跟踪 |