Invention Grant
- Patent Title: Nano material testing apparatus and method for testing material using the same
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Application No.: US15372354Application Date: 2016-12-07
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Publication No.: US10281379B2Publication Date: 2019-05-07
- Inventor: Ju Young Kim , Young Cheon Kim , Si Hoon Kim
- Applicant: UNIST(ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- Applicant Address: KR Ulsan
- Assignee: UNIST(ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- Current Assignee: UNIST(ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- Current Assignee Address: KR Ulsan
- Agency: Revolution IP, PLLC
- Priority: KR10-2016-0074575 20160615
- Main IPC: H04N5/247
- IPC: H04N5/247 ; G01N3/06 ; G01N3/08 ; G01N3/20

Abstract:
A nano material testing apparatus includes a main frame; a testing unit including an actuator and a load cell connected to the actuator; a jig unit configured to be connected to the testing unit and including an upper jig that clamps one side of an upper portion of the nano material specimen and a lower jig that is located below the upper jig and clamps one side of a lower portion of the nano material specimen; a stage unit configured to be connected to the lower jig; a first alignment unit configured to be located to be spaced apart from a front surface of the nano material specimen; a second alignment unit configured to be located to be spaced apart from side surfaces of the nano material specimen; and a controller.
Public/Granted literature
- US20170363523A1 NANO MATERIAL TESTING APPARATUS AND METHOD FOR TESTING MATERIAL USING THE SAME Public/Granted day:2017-12-21
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