Invention Grant
- Patent Title: Sampling device including mechanical force feedback mechanism
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Application No.: US15374333Application Date: 2016-12-09
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Publication No.: US10281366B2Publication Date: 2019-05-07
- Inventor: James P. Bilodeau , Thomas A. Hagerty
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01N1/20
- IPC: G01N1/20 ; G01N1/02

Abstract:
The present disclosure includes a sampling device for collecting a sample from a target surface, the sample device including a handle, a body extending from the handle, and a mechanical force feedback mechanism. The mechanical force feedback mechanism is configured to change an orientation of the body relative to the handle when force is applied to a target surface by the sampling device.
Public/Granted literature
- US20180164189A1 SAMPLING DEVICE INCLUDING MECHANICAL FORCE FEEDBACK MECHANISM Public/Granted day:2018-06-14
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