• Patent Title: Reference mark detector arrangement
  • Application No.: US15024507
    Application Date: 2014-09-26
  • Publication No.: US10281301B2
    Publication Date: 2019-05-07
  • Inventor: Jason Kempton Slack
  • Applicant: RENISHAW PLC
  • Applicant Address: GB Wotton-under-Edge
  • Assignee: RENISHAW PLC
  • Current Assignee: RENISHAW PLC
  • Current Assignee Address: GB Wotton-under-Edge
  • Agency: Oliff PLC
  • Priority: EP13275237 20131001
  • International Application: PCT/EP2014/070614 WO 20140926
  • International Announcement: WO2015/049173 WO 20150409
  • Main IPC: G01D5/38
  • IPC: G01D5/38 G01D5/347 G01D5/36
Reference mark detector arrangement
Abstract:
An encoder apparatus comprising a scale comprising scale features in at least one track which define a series of incremental scale marks and at least one reference mark and a readhead comprising a light source, a diffraction grating, an incremental photodetector and a reference photodetector comprising at least two detector channels. The features defining the at least one reference mark are configured such that the at least one reference mark as resolvable by each of the at least two detector channels comprises a single feature. The optical arrangement of the encoder is such that a non-imaged representation of at least the track in which the at least one reference mark is contained falls onto the detector.
Public/Granted literature
Information query
Patent Agency Ranking
0/0