Invention Grant
- Patent Title: III-nitride based semiconductor device with low vulnerability to dispersion and backgating effects
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Application No.: US15452955Application Date: 2017-03-08
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Publication No.: US10263069B2Publication Date: 2019-04-16
- Inventor: Steve Stoffels , Yoganand Saripalli
- Applicant: IMEC VZW
- Applicant Address: BE Leuven
- Assignee: IMEC VZW
- Current Assignee: IMEC VZW
- Current Assignee Address: BE Leuven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Priority: EP16159090 20160308
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L21/225 ; H01L21/285 ; H01L21/306 ; H01L21/324 ; H01L29/20 ; H01L29/205 ; H01L29/778 ; H01L29/861 ; H01L29/417 ; H01L29/10 ; H01L29/423 ; H01L29/207

Abstract:
The present disclosure is related to a III-Nitride semiconductor device comprising a base substrate, a buffer layer, a channel layer, a barrier layer so that a 2-dimensional charge carrier gas is formed or can be formed near the interface between the channel layer and the barrier layer, and at least one set of a first and second electrode in electrical contact with the 2-dimensional charge carrier gas, wherein the device further comprises a mobile charge layer (MCL) within the buffer layer or near the interface between the buffer layer and the channel layer, when the device is in the on-state. The device further comprises an electrically conductive path between one of the electrodes and the mobile charge layer. The present disclosure is also related to a method for producing a device according to the present disclosure.
Public/Granted literature
- US20170263700A1 III-Nitride Based Semiconductor Device with Low Vulnerability to Dispersion and Backgating Effects Public/Granted day:2017-09-14
Information query
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