An integrated circuit chip includes an interleaved analog-to-digital converter (ADC) and an interleaving calibration circuit. The interleaved ADC includes a plurality of ADCs that are each configured to sample an analog signal. The interleaved ADC is configured to convert the analog signal into an interleaved analog-to-digital signal (IADC signal) that includes a plurality of spurious signals formed from mismatches between the plurality of ADCs. The interleaving calibration circuit is configured to receive the IADC signal from the interleaved ADC, generate a mismatch profile estimate corresponding to the plurality of spurious signals to generate one or more mismatch profile estimates, determine whether a first mismatch profile estimate is in a frequency band of interest, and, in response to a determination that the first mismatch profile estimate is in the frequency band of interest, generate a set of model parameters based on the first mismatch profile estimate.