Invention Grant
- Patent Title: Methods and systems for detecting ESD events in cabled devices
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Application No.: US14619023Application Date: 2015-02-10
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Publication No.: US10249330B2Publication Date: 2019-04-02
- Inventor: Myron H. Gentrup , Icko E. T. Iben , John T. Kinnear, Jr.
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Zilka-Kotab, P.C.
- Main IPC: G11B5/455
- IPC: G11B5/455 ; G01R29/08 ; G01R31/00 ; H01L23/60 ; H01L45/00 ; G11B5/31 ; G11B5/60

Abstract:
An audit device according to one embodiment includes a substrate; at least one test element coupled to the substrate; a connector adapted for coupling the at least one test element to leads of a cable; and a probe for detecting at least one of: voltage across and current through the at least one test element. One test element is coupled to a group of leads of the connector. All positive polarity leads of the group of leads are coupled together on the substrate, and all negative polarity leads of the group of leads are coupled together on the substrate, such that the test element is coupled across the positive and the negative coupled leads of the group of leads of the connector. The test element is coupled across pairs of leads of the cable when the cable is coupled to the connector. Additional systems and methods are also presented.
Public/Granted literature
- US20150154993A1 METHODS AND SYSTEMS FOR DETECTING ESD EVENTS IN CABLED DEVICES Public/Granted day:2015-06-04
Information query
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