The present invention provides an input device test system, configured to test an input device having a plurality of functional elements. The input device test system includes: a test host, configured to execute a test program and a message interception program, and output a test message by means of the test program; and a test platform, configured to receive the test message and operate the input device according to the test message, where the input device outputs a response message to the test host in response to the operation, where the message interception program is used to intercept the response message and convert the response message into at least one code, and the test program determines whether the at least one code is consistent with the test message.