“Shoot-through” timing failures in a scan chain of a defective semiconductor integrated circuit corrupt test pattern data used to perform failure analysis. Methods and procedures are provided to detect “shoot-through” conditions, determine the number of shoot-through scan cells, and to determine the location of the shoot-through cells within a scan chain. Reset test pattern results can be analyzed to identify candidate locations of shoot-through cells and when combined with candidate cell locations from analysis of physical clock distribution trees and potential clock-skew issues, the exact location of all shoot-through cells can be determined. Methods are also provided to use shoot-through cell locations to identify the defective clock net containing the physical defect causing the clock skew conditions needed to produce shoot-through timing failures.