Invention Grant
- Patent Title: System and method for measurement of material property using variable reflector
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Application No.: US14392282Application Date: 2014-06-27
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Publication No.: US10247680B2Publication Date: 2019-04-02
- Inventor: Peter Annan , David Redman
- Applicant: Sensors & Software Inc.
- Applicant Address: CA Mississauga
- Assignee: SENSORS & SOFTWARE INC.
- Current Assignee: SENSORS & SOFTWARE INC.
- Current Assignee Address: CA Mississauga
- Agency: Bereskin & Parr LLP/S.E.N.C.R.L., S.R.L.
- International Application: PCT/CA2014/050618 WO 20140627
- International Announcement: WO2014/205582 WO 20141231
- Main IPC: G01N22/04
- IPC: G01N22/04 ; G01N22/00 ; G01N33/24 ; G01S7/41 ; G01N33/38 ; G01N33/46

Abstract:
A system and method for measuring a material includes at least one transmitter for transmitting a first signal and a second signal. A variable reflector reflects a portion of the first signal at a first reflecting property to produce a first reflected signal, the portion of the first signal having traveled through the material. The variable reflector also reflects a portion of the second signal at a second reflecting property to produce a second reflected signal, the portion of the second signal having traveled through the material. A receiver receives the first received signal and the second received signal, the first received signal includes the first reflected signal having traveled through the material and the second received signal includes the second reflected signal having traveled through the material. The first reflected signal and the second reflected signal providing an indication of at least one property of the material. The at least one property includes permittivity, attenuation, anisotropy, and frequency dependency of the material.
Public/Granted literature
- US20160187266A1 SYSTEM AND METHOD FOR MEASUREMENT OF MATERIAL PROPERTY USING VARIABLE REFLECTOR Public/Granted day:2016-06-30
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