Invention Grant
- Patent Title: Spectrometer, method for manufacturing a spectrometer, and method for operating a spectrometer
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Application No.: US14527796Application Date: 2014-10-30
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Publication No.: US10247604B2Publication Date: 2019-04-02
- Inventor: Christian Obermueller
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee Address: DE Neubiberg
- Agency: Viering, Jentschura & Partner MBB
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/45 ; G01J3/26 ; G02B26/00 ; G02B13/00

Abstract:
In various embodiments a spectrometer is provided. The spectrometer may include a first mirror unit which is semitransparent for electromagnetic radiation of at least one wavelength or wavelength range; and a second mirror unit having a first area and a second area facing the first mirror unit, wherein at least a part of the first area and the second area are spaced apart from the first mirror unit, wherein the first area is at least partially reflective for the electromagnetic radiation of at least one wavelength or wavelength range, wherein the second area includes at least a part of a photodetector, and wherein the photodetector is configured to detect the electromagnetic radiation of at least one wavelength or wavelength range.
Public/Granted literature
- US20160123808A1 SPECTROMETER, METHOD FOR MANUFACTURING A SPECTROMETER, AND METHOD FOR OPERATING A SPECTROMETER Public/Granted day:2016-05-05
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