Invention Grant
- Patent Title: Semiconductor device and method for manufacturing the same
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Application No.: US15690481Application Date: 2017-08-30
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Publication No.: US10243037B2Publication Date: 2019-03-26
- Inventor: Shinya Kyogoku , Ryosuke Iijima
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Minato-ku
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2016-212712 20161031
- Main IPC: H01L27/082
- IPC: H01L27/082 ; H01L29/06 ; H01L21/04 ; H01L29/10 ; H01L29/16 ; H01L29/66 ; H01L29/78

Abstract:
According to one embodiment, a semiconductor device includes first to fourth semiconductor regions, a first electrode, and a first insulating film. The first semiconductor region includes a first partial region and a second partial region. The second semiconductor region is separated from the first partial region. The third semiconductor region is provided between the first partial region and the second semiconductor region. The third semiconductor region includes a third partial region and a fourth partial region. The first electrode is separated from the second partial region and is separated from the second semiconductor region and the third semiconductor region. The first insulating film includes a first insulating region and a second insulating region. The fourth semiconductor region includes a first portion. The first portion is provided between the fourth partial region and at least a portion of the first insulating film.
Public/Granted literature
- US20180122894A1 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2018-05-03
Information query
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