Invention Grant
- Patent Title: Thermal imaging device and thermal image photographing method
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Application No.: US14371441Application Date: 2013-01-10
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Publication No.: US10230908B2Publication Date: 2019-03-12
- Inventor: Hao Wang
- Applicant: MISSION INFRARED ELECTRO OPTICS TECHNOLOGY CO., LTD
- Applicant Address: CN Hangzhou
- Assignee: MISSION INFRARED ELECTRO OPTICS TECHNOLOGY CO., LTD
- Current Assignee: MISSION INFRARED ELECTRO OPTICS TECHNOLOGY CO., LTD
- Current Assignee Address: CN Hangzhou
- Priority: CN201210008402 20120112; CN201210008404 20120112; CN201210353428 20120921
- International Application: PCT/CN2013/070340 WO 20130110
- International Announcement: WO2013/104327 WO 20130718
- Main IPC: G01J5/00
- IPC: G01J5/00 ; H04N5/33 ; H04N9/64 ; H04N5/232 ; H04N5/262 ; H04N5/265

Abstract:
This invention provides a thermal imaging device and a thermal image photographing method. In the prior art, when the thermal imaging device is used, a photographing part, photographing angle, and photographing distance of a photographed object are selected according to subjective experience of users, thus lowering photographing speeds and having omissions, and a position, dimension, and angle of thermal images of similar photographed objects in infrared thermal images photographed each time are different, causing subsequent analysis trouble. In this invention, via a reference image with a specified position and specified dimension presented in the infrared thermal image and reflecting specified morphological characters of the photographed object, a visual reference of predetermined thermal image quality and photographing requirements of the photographing object is provided, assisting the users to correctly grasp imaging states and photographing distances of the thermal image, thereby acquiring uniform normative thermal image of the photographed object.
Public/Granted literature
- US20150042817A1 THERMAL IMAGING DEVICE AND THERMAL IMAGE PHOTOGRAPHING METHOD Public/Granted day:2015-02-12
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