- Patent Title: X-ray data processing apparatus and method and program for the same
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Application No.: US15177611Application Date: 2016-06-09
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Publication No.: US10222491B2Publication Date: 2019-03-05
- Inventor: Kazuyuki Matsushita , Takuto Sakumura , Yasukazu Nakaye
- Applicant: Rigaku Corporation
- Applicant Address: JP Tokyo
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2015-127043 20150624
- Main IPC: G01T1/24
- IPC: G01T1/24 ; G01T7/00 ; G01T1/17

Abstract:
The X-ray data processing apparatus to estimate a true value from an X-ray count value detected by the pixel array X-ray detector of a photon counting system includes a management unit 210 to receive and manage a detection value for each detection part, an effective area ratio calculation unit 230 to calculate a ratio of a detection ability under the influence of the charge share to an original detection ability in the detection part as an effective area ratio of the detection part using data regarding the detection part and data regarding an X-ray source and a detection energy threshold value, and a correction unit 250 to correct the managed count value using the calculated effective area ratio to estimate a true value.
Public/Granted literature
- US20160377749A1 X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM FOR THE SAME Public/Granted day:2016-12-29
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