Invention Grant
- Patent Title: Scan condition determining apparatus and method for a magnetic resonance imaging system
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Application No.: US15046226Application Date: 2016-02-17
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Publication No.: US10222440B2Publication Date: 2019-03-05
- Inventor: Yoshihiro Tomoda , Masanori Ozaki
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Priority: JP2015-028660 20150217
- Main IPC: G01R33/54
- IPC: G01R33/54 ; G01R33/563

Abstract:
There is provided a scan condition determining apparatus for a magnetic resonance imaging system comprising accepting means for accepting specification of a desired scan time; and searching means for searching for a second scan condition based on a first scan condition defined before the specification, by adjusting values of parameters affecting a scan time or a signal-to-noise ratio of signals obtained by a scan, said second scan condition being one with which the scan time approximates within an allowable range or matches the desired scan time, and besides, a lowest value of a relative signal-to-noise ratio of the signals approximates within an allowable range or matches a lowest value of the relative signal-to-noise ratio of the signals estimated based on the first scan condition. The parameters include, for example, any one of a number of times of addition, a y-axis direction resolution, a repetition time, and a number of data acquisition passes.
Public/Granted literature
- US20170023657A1 SCAN CONDITION DETERMINING APPARATUS AND METHOD FOR A MAGNETIC RESONANCE IMAGING SYSTEM Public/Granted day:2017-01-26
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