Speckle interferometric method and system for detecting a movement of a surface
Abstract:
A method and a system for detecting a movement of a surface on an irradiated sample involves a light source for irradiating the surface with a coherent light beam, a detector for detecting variations caused by the movement in a speckle pattern produced by reflections of the light beam at the surface, selecting a single speckle from the speckle pattern, and detecting the variations at the selected speckle.
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