A semiconductor integrated circuit includes a first circuit, a second circuit, a memory circuit having a plurality of flip-flops, a storage unit, a signal generating unit to produce an operation mode setting signal, a control circuit configured to cause the memory circuit to operate such that the plurality of flip-flops holds a value for setting characteristics of the first circuit when the operation mode setting signal indicates a first operation mode, and configured to cause the memory circuit to operate as a counter to measure a time length used in the second circuit when the operation mode setting signal indicates a second operation mode, and a setting circuit configured to cause trimming data stored in the storage unit to set the characteristic of the first circuit when the operation mode setting signal indicates the second operation mode, the trimming data corresponding to the value held by the memory circuit.