Invention Grant
- Patent Title: Semiconductor device having impedance calibration function to data output buffer and semiconductor module having the same
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Application No.: US15402909Application Date: 2017-01-10
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Publication No.: US10200044B2Publication Date: 2019-02-05
- Inventor: Kentaro Hara
- Applicant: LONGITUDE SEMICONDUCTOR S.A.R.L.
- Applicant Address: IE Dublin
- Assignee: Longitude Licensing Limited
- Current Assignee: Longitude Licensing Limited
- Current Assignee Address: IE Dublin
- Agency: Kunzler, PC
- Priority: JP2011-222935 20111007
- Main IPC: H03K17/16
- IPC: H03K17/16 ; H03K19/0185 ; H03K19/003 ; H03K19/0175 ; G11C29/02 ; G11C29/12 ; G11C29/48 ; G11C11/4093 ; H03K19/00 ; H03K19/094 ; G11C11/4094 ; G11C11/40 ; G11C11/4076
Abstract:
Disclosed herein is a semiconductor device that includes a first transistor unit coupled to the data terminal, and a plurality of second transistor units coupled to the calibration terminal. The first transistor unit includes a plurality of first transistors having a first conductivity type connected in parallel to each other so that an impedance of the first transistor unit is adjustable. Each of the second transistor units includes a plurality of second transistors having the first conductivity type connected in parallel to each other so that an impedance of each of the second transistor units is adjustable. The semiconductor device further includes an impedance control circuit that reflects the impedance of each of the second transistor units to the first transistor unit.
Public/Granted literature
Information query
