Invention Grant
- Patent Title: Simultaneous scan chain initialization with disparate latches
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Application No.: US15974033Application Date: 2018-05-08
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Publication No.: US10199121B2Publication Date: 2019-02-05
- Inventor: Mitesh Agrawal , Benedikt Geukes , Krishnendu Mondal
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Robert J. Shatto
- Main IPC: G11C29/02
- IPC: G11C29/02 ; G11C7/20 ; G11C7/10 ; G11C7/22

Abstract:
Provided is an integrated circuit that includes a reset electrically connected to a select line of a multiplexer and an OR gate. The multiplexer receives data from a power source. The multiplexer and the OR gate comprise a circuit. A clock is electrically connected to the OR gate. The OR gate is electrically connected to a clock input of a latch. The latch includes the clock input, a scan enable input, a data input, and a data output. A regular logic data path is electrically connected to the multiplexer, and the multiplexer is further electrically connected to the data port of the latch.
Public/Granted literature
- US20180294042A1 SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES Public/Granted day:2018-10-11
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