Invention Grant
- Patent Title: Stress detection in a flash memory device
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Application No.: US15607422Application Date: 2017-05-26
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Publication No.: US10199114B2Publication Date: 2019-02-05
- Inventor: I-Heng Huang , Benish Babu , Steven Haehnichen , Robert Coleman
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/34 ; G11C11/56 ; G11C16/28 ; G06F3/06

Abstract:
A flash memory device includes an array of non-volatile memory (NVM) cells, at least one detection NVM cell, and a sensing circuit. The array of NVM cells are configured to store data. The sensing circuit is coupled to the at least one detection NVM cell and is configured to measure a charge on the at least one detection NVM cell. The sensing circuit is also configured to compare the measured charge with a threshold charge level and to trigger a refresh of the array of NVM cells in response to the measured charge being less than the threshold charge level.
Public/Granted literature
- US20180342306A1 STRESS DETECTION IN A FLASH MEMORY DEVICE Public/Granted day:2018-11-29
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